Göksel Durkaya, Yrd. Doç. Dr.

Göksel Durkaya

İletişim Bilgileri

Telefon:8822
Ofis:B2025
Bağlı Olduğu Bölüm:Metalurji ve Malzeme Mühendisliği Bölümü
http://www.atilim.edu.tr/~goksel.durkaya

Akademik Dereceler

DereceAlanÜniversiteYıl
Doktora Fizik Georgia State University 2009
Yüksek Lisans Fizik Georgia State University 2008
Yüksek Lisans Fizik Orta Doğu Teknik Üniversitesi 2005
Lisans Fizik Orta Doğu Teknik Üniversitesi 2002


Akademik Ünvanlar

DereceÜniversiteAyYıl
Yardımcı Doçent Atılım Üniversitesi 2013


Yayınlar

SCI, SCI-E, SSCI ve AHCI

G. Durkaya, A. Rastegar, H. Kurtuldu (2012), Effect of radiation exposure on the surface adhesion of Ru-capped MoSi multilayer blanks, PHOTOMASK TECHNOLOGY 2012, San Jose, California, 0277-786X

T. Sheps, J. Brocious, B. L. Corso, O. T. Gül, D. Whitmore, G. Durkaya, E. O. Potma, and P. G. Collins (2012), Four-wave mixing microscopy with electronic contrast of individual carbon nanotubes, Phys. Rev. B, 86, 235412

A.Rastegar, G. Durkaya, A. Cepler, S. Novak (2012), Effect of radiation on the defectivity and stability of Ru-capped MoSi multilayerblanks, EXTREME ULTRAVIOLET (EUV) LITHOGRAPHY III, San Jose, California, 8322, 832211

G. Durkaya, M. Buegler, M. Alevli, R. Atalay, I. Senavirathna, M. Kaiser, O. Hitzemann, A.Hoffmann, N. Dietz (2010), The influence of the group V/III molar precursor ratio on the structural properties of InGaN layers grown by HPCVD, Physica Status Solidi (a), 207(6), pp.1379-1382

P. Lu, R. Collazo, R.F. Dalmau, G. Durkaya, N. Dietz, B. Raghothamachar, M. Dudley, Z. Sitar (2009), Seeded growth of AlN bulk crystals in m- and c-orientation, Journal of Crystal Growth , 312 58–63

P. Lu, R. Collazo, R. F. Dalmau, G. Durkaya, N. Dietz and Z. Sitar (2008), Different optical absorption edges in AlN bulk crystals grown in m- and c-orientations, Applied Physics Letters , 93(13) pp. 131922-3

N. Dietz, M. Alevli, R. Atalay, G. Durkaya, R. Collazo, J. Tweedie, S. Mita, and Z. Sitar, “ (2008), The influence of substrate polarity on the structural quality of InN layers grown by high-pressure chemical vapor deposition, Applied Physics Letters , 92(4) pp. 041911-3

M. Alevli, G. Durkaya, R. Atalay, R. Kirste, A. Weerasekara, A. G. U. Perera, A. Hoffmann and N. Dietz (2008), Optical characterization of InN layers grown by high-pressure chemical vapor deposition, Journal of Vacuum Science and Technology A, 26(4), pp. 1023-1026

M. Alevli, G. Durkaya, V. Woods, U. Habeck, H. Kang, J. Senawiratne, M. Strassburg, I. T.Ferguson, A. Hoffmann, and N. Dietz (2006), Properties of InN grown by high-pressure CVD, GaN, AIN, InN and Related Materials, 892, ISBN: 1-55899-846-2, FF6.2,

M. Alevli, G. Durkaya, , A. Weerasekara, A.G.U. Perera, N. Dietz, W. Fenwick, V. Woods and I. Ferguson (2006), Characterization of InN layers grown by high-pressure chemical vapor deposition, Applied Physics Letters , 89, pp. 112119

Uluslararası Konferans Bildirileri

G. Durkaya, M. Alevli, M. Buegler, R. Atalay, S. Gamage, M. Kaiser, R. Kirste, A. Hoffmann, M. Jamil, I. Ferguson and N. Dietz (2010), The effects of V/III molar ratio on structural properties of In65Ga35N layers grown by HPCVD, MRS Symposium Proc, San Francisco, California, 1202, paper# 1202-I05-21

M. Buegler, M. Alevli, R. Atalay, G. Durkaya, I. Senevirathna, M. Jamil, I. Ferguson, and N. Dietz (2009), Optical and structural properties of InN grown by HPCVD, Proc. of SPIE, , San Diego, California, Vol. 7422 pp.742218-1-6

M. Alevli, G. Durkaya, R. Kirste, A. Weesekara, W. E. Fenwick, V. T. Woods, I. T. Ferguson, A. Hoffmann, A.G.U. Perera and N. Dietz (2007), Properties of InN layers grown by High Pressure CVD, MRS Symposium Proc. , Warrendale, Pennsylvania , 955E, Paper# 0955-I08-04, pp.1-6